MiniFlex course
By taking this course, you will gain an understanding of what the MiniFlex device is, and learn how to obtain high-quality data under the correct measurement conditions. You will also be able to perform various analyses, including profile processing and qualitative and quantitative analysis.
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SmartLab Powder XRD course
By taking this course, you will gain an understanding of the SmartLab system configuration, the roles of various components, detectors, and parts. You will also learn how to obtain high-quality data under the correct measurement conditions and perform various analyses, including profile processing and qualitative and quantitative analysis.
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SmartLab Thin Film I course
In Thin Film Course I, you will learn the basics of thin film material scanning (2θ/θ, 2θ scan, in-plane measurement) as well as the measurement and analysis of reflectivity and pole figures. By taking this course, you will be able to perform qualitative analysis and orientation evaluation using out-of-plane and in-plane measurements, evaluate the thickness and density of thin film samples, and analyze the crystallographic orientation and texture of thin film samples and single-crystal materials.
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SmartLab Thin Film II course
In Thin Film Practice Course II, you will primarily learn about high-resolution rocking curves and reciprocal space maps, which are applied to epitaxial thin films and single-crystal bulk samples. By taking this course, you will be able to evaluate the thickness of epitaxial thin films, the composition ratio of solid solution layers, lattice constants, and the strain/relaxation state.
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